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Schafer's Vallecitos Laboratory (SVL) and its staff are dedicated to performing materials analysis on a wide variety of samples. SVL sample processing capabilities include two clean rooms (class 10 and class 100) containing modern laboratory equipment. SVL Optical Microscopy Group, experts in materials analysis, have at their disposal several polarized light microscopes and stereo microscopes. Optical analytical techniques include dispersion staining, differential interference microscopy, darkfield, fluorescence, and chemical microscopy.
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 This ESEM is an image of a particle on RF foam. The particle was probably introduced after the foam was cut, because it is on the surface, but before the foam was dried, because the chemicals that make up the particle have bled into the foam. An EDS analysis shows that the particle contains Zinc and Potassium. |
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SVL Microbeam and X-ray Microanalysis Group provides qualitative, semi-quantitative and quantitative elemental analyses. These are obtained from two field emission scanning electron microscopes (FESEMs), an electron probe microanalyzer (EPMA) and a transmission electron microscope (TEM) with full analytical capability (AEM). This latter instrument is used to determine structure and chemical information by means of selected area diffraction (SAD), parallel electron energy loss spectrometer (PEELS) and energy dispersive analyses (EDS); it also has backscattered electron (BSE) detection capability. |
In addition to providing elemental analysis, the FESEMs are also used to obtain detailed images of samples, which can be digitally enhanced and stored in a catalog. One of the FESEMs has a wavelength dispersive spectrometer (WDS) as well as an EDS. This instrument has the unique capability of providing in-situ analysis in either or both EMP-WDS mode and the FESEM-EDS mode. The microbeam group also operates an x-ray diffractometer (XRD) instrument fitted with a microfocus diffractometer providing crystal structure and stoichiometric information. Some organic analyses can be achieved by using a Fourier Transform Infrared Spectrometer (FT-IR) fitted with an IR microscope and also using High Performance Liquid Chromatography (HPLC).
Contact Jim Heuer to receive your free brochure describing each of these capabilities.
 Optical microscopy
X-ray diffraction (XRD)
Field Emission SEM
Environmental SEM (ESEM)
Electron Probe Microanalysis (EPMA)
Energy Dispersive X-ray Spectrometry (EDS)
X-ray diffraction (XRD)
Fourier Transform IR Spectrometry (FTIR)
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